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Notice of IEEE FENDT 2017 (the first
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Notice of IEEE FENDT 2017 (the first round)


In order to strengthen the international exchange and cooperation in the field of nondestructive testing and evaluation, promote the development of China's nondestructive testing technology, we are in an opening-up posture and the biggest enthusiasm to welcome the people from all the world who are engaged in or pay attention to NDT/E technology and instruments to participate this Forum. Through this Forum, the participants will get various and the latest information of such as nondestructive inspection and evaluation technology, equipment and facilities. The participants can develop the ideas and catch the tendency, and accelerate the theoretical research, technology development, application and innovation in NDT/E fields. We wish to make friends with you, enhance mutual understanding, build a broader and more effective cooperation.

Conference Date
June 22-24, 2017 (Registration on June 21, 2017)

Venue of the conference
Shaanxi Guesthouse, Zhangba north load No. 1, Xi’an, China.


IEEE Beijing Section
Xi'an JiaoTong University
CNPC Tubular Goods Research Institute (TGRI)
The Inspection & Research Institute of Boiler & Pressure Vessel of Shaanxi Province
Shaanxi Province Special Equipment Safety Supervision Inspection
Xi'an Special Equipment Inspection Institute
Shanxi XiYu Non-destructive Testing Co.,Ltd.
Nanjing FaYi Meeting Exhibition Co.,Ltd.

China Special Equipment Inspection and Research Institute (CSEI)
The Special Equipment Safety Supervision Inspection Institute of Jiangsu Province (JSSEI)
Zhejiang Provincial Special Equipment Inspection and Research Institute
Nanjing University
Nanjing University of Aeronautics and Astronautics
Beijing Institute of Technology
Southeast JiaoTong University
University of Electronic Science and Technology of China
Nanjing University of Science &Technology
China Nuclear Power Engineering Co.,Ltd.
CGN Inspection Technology Co.,Ltd.
The Acoustical Society of Jiangsu

Academic Committee

Dr. Uwe Ewert, BAM, Germany, Chairman of IEEE FENDT 2017
Prof. B. Venkatraman, Professor of Homi Bhabha National Institute, India
Prof. Cho, Younho, Pusan National University, Korea
Prof. Christian Boller, Fraunhofer Institute for Non-Destructive Testing, Germany
Prof. Chunguang Xu, Beijing Institute of Technology
Prof. Cunfu He, Beijing University of Technology
Prof. Fu-Kuo Chang, Stanford University, US
Dr. Gerd Dobmann, Fraunhofer Society for IZFP, Dresden, Germany
Prof. Guiyun Tian, Newcastle University, Britain.
Prof. Jan Achenbach, Walter P. Murphy and Distinguished McCormick School
Prof. Leonard Bond, Director of the Center for NDE, Iowa State University
Dr. Mike Farley, Chairman of the International Committee of NDT
Prof. Reza Zoughi, Missouri university of science and technology(s&T)
Prof. Ryszard Sikora, Westpomeranian University of Technology, Poland
Prof. Shuqing Lin, President of China Special Equipment Inspection and Research Institute
Prof. Shu-yi Zhang, Nanjing University, a Member of Chinese Academy of Sciences (1991)
Prof. Sohichi Hirose, President of the Japanese Society for Non-Destructive Inspection
Prof. Songling Huang, Tsinghua University
Prof. Sridhar Krishnaswamy, Northwestern University
Prof. Tianpeng Qiang, General Conference Chairman of FENDT
Prof. Tomasz Chady, West Pomeranian University of Technology
Prof. Xiaorong Gao, Southwest Jiaotong University
Prof. Xiaozhou Liu, Nanjing University
Prof. Yan Han, Vice President of North China University
Prof. Yi-Qing NI, The Hong Kong Polytechnic University
Prof. Zhenmao Chen, Xi’an Jiaotong University
Prof. Zhonghua Shen, Nanjing University of Sci. and Tech

Official Website 
( for Chinese)

Important Dates


Jan. 10 -Feb. 28, 2017

Registration of academic/technical presentation

February 28, 2017

Registration and abstract submission

February 28, 2017

Submission deadline of full papers

May 10, 2017

Paper receiving notice

June 10, 2017

Payment and receipt

May 1, 2017

Conference registration fee discount

May 20, 2017

Registration on-site

June 21, 2017


June 22-24, 2017



Person in charge

Nuclear power nondestructive testing

Prof. CongBin Zhu

The high speed rail detection technology

Prof. XiaoRong Gao

The robot +

Prof. WeiCan Guo

NQI of The 13th Five-Year Plan

Prof. ShuQing Lin

Phased array testing technique

Prof. Hui Zheng

New energy Structure health testing

Prof. ZhengMao Chen

Electromagnet testing

Prof. XiaoRong Gao

Digital radiography

Prof. TianPeng Qiang

Ultrasound & Photo-acoustic

Prof. XiaoZhou Liu

Academic symposium of China, Japan and South Korea

Prof. ChunGuang Xu

Academic and Technological Reports

Academic & technical reports are the core of Forum for academic exchanges. Except invite all academic committee members, the scientific and technological workers from sponsors and parterners, and the famous experts from home and abroad to make academic reports or technical reports.  FENDT2017 also accepts any report in NDT/E made by scientific and technological workers from all the world.

We encourage participants who plan to attend the conference pre-registrate before Feb. 28. You just need submit the title and abstract of your report by sending a mail to

Scope of the report can also be involved in nondestructive testing:
 Research on fundamental theory
 Research on the applied technology
 Design and research of testing equipment
 Testing technology and craft
 Regulation and standard
 Training, education, qualification and certification
 Safety and reliability
 Material properties and failure analysis
 Some other related

Call for paper

FENDT2017 would like to collect papers of NDT research results, application cases, summary analysis from NDT researchers, manufacturers, end-users and technicians at home and abroad.

The major topics of FENDT2017 include but not limited to:

 Ultrasonic Testing
 Radio-graphic Testing
 Eddy current Testing
 Magnetic particle Testing
 Acoustic Testing
 NDT Image Processing Technology
 Infrared , Laser and Microwave Detection Technology

The conference papers that have been reviewed by experts organized will be included in the proceedings of  IEEE 2017 FENDT and will also be retrieved in EI. The Forum will set up first/ second/third prizes, award certificates and bonus.